A random-walk benchmark for single-electron circuits

David Reifert, Martins Kokainis, Andris Ambainis, Vyacheslavs Kashcheyevs, Niels Ubbelohde

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Mar 25, 2020
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Received Date: 6th March 20

Precise manipulation of individual quantum particles in complex single-electron circuits for sensors, quantum metrology, and quantum information transfer [1, 2] requires tools to certify fidelity and establish a scalable error model. A similar challenge arises in the gate-basedapproach to universal quantum computation [3–8] where benchmarking gate sequences [9–13] are employed to validate independent-error models [14] which are crucial forscaling towards fault-tolerance [15, 16]. Here, we introduce the idea of benchmarking by error accumulationto integrated single-electron circuits. We experimentally realize clock-controlled transfer of electrons through achain of quantum dots, and describe the statistics of accumulated charge by a random-walk model. High-fidelity components and unprecedented accuracy of charge counting enable the detection of excess noise beyond the sampling error, the identification of the timescale for consecutive step interaction, and an accurate estimate forthe failure probabilities of the elementary charge transfer. Abstracting errors from component to circuit levelopens a path to leverage charge counting for microscopic certification of electrical quantities challenging the precision of metrological measurements [17], and to introducefidelity control in building blocks of quantum circuits [18–21].

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This is an abstract of a preprint hosted on an independent third party site. It has not been peer reviewed but is currently under consideration at Nature Communications.

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